Memory BIST Generation
Most of the SOC contains embedded memory. Memory Built In Self Test (BIST) is an effective to test the memories without an design impact. We can analyze your platform architecture and product initiatives to determine how the memory BIST should be designed and implemented.
Logic BIST Insertion
Logic Built In Self Test (BIST) leverages a scan based design to minimize the requirements for external test stimulus which reduces capital investment on test equipments.
Testamatic Systems has extensive experience generating many different types of Memory BIST solutions. Our solutions will help you to integrate BIST logic into your design.